SCOPUS
IEEE International Conference on Microelectronic Test Structures
Publisher information is not available.
Identifiers, indexing coverage, and citation metrics for the academic journal IEEE International Conference on Microelectronic Test Structures. Identifiers: ISSN 1071-9032, eISSN 2158-1029. Indexed in SCOPUS.
CiteScore
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Scopus citation metric
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SCImago rank
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Source normalized impact
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JIF percentile rank
Journal profile
- ISSN
- 1071-9032
- eISSN
- 2158-1029
- Abbreviation
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- Publisher
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- Country
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Web of Science categories
No Web of Science category data available.
Scopus ASJC categories
2208 Electrical and Electronic Engineering