SCOPUS
IEEE International Test Conference (TC)
Publisher information is not available.
Identifiers, indexing coverage, and citation metrics for the academic journal IEEE International Test Conference (TC). Identifiers: ISSN 1089-3539. Indexed in SCOPUS.
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Scopus citation metric
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Journal profile
- ISSN
- 1089-3539
- eISSN
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- Country
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Web of Science categories
No Web of Science category data available.
Scopus ASJC categories
2208 Electrical and Electronic Engineering2604 Applied Mathematics