SCIEQ2

Surface Topography-Metrology and Properties

IOP Publishing Ltd

Surface Topography-Metrology and Properties is an academic journal published by IOP Publishing Ltd. Identifiers: ISSN 2051-672X, eISSN 2051-672X. Indexed in SCIE. Metrics: JIF 2.4. Subject areas: ENGINEERING, INSTRUMENTS & INSTRUMENTATION, MATERIALS SCIENCE, MATERIALS SCIENCE, MULTIDISCIPLINARY. tlooto lists 1,406 papers from this journal.

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Journal profile

ISSN
2051-672X
eISSN
2051-672X
Abbreviation
SURF TOPOGR-METROL
Publisher
IOP Publishing Ltd
Country
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Web of Science categories

SCIEENGINEERING, INSTRUMENTS & INSTRUMENTATION, MATERIALS SCIENCE, MECHANICAL, MULTIDISCIPLINARY

Scopus ASJC categories

No ASJC category data available.

Keywords

Engineering, Mechanical | Instruments & Instrumentation | Materials Science, Multidisciplinary

Papers in this journal