SCOPUS
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
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Identifiers, indexing coverage, and citation metrics for the academic journal Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT. Identifiers: ISSN 2576-1501, eISSN 2765-933X. Indexed in SCOPUS.
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Journal profile
- ISSN
- 2576-1501
- eISSN
- 2765-933X
- Abbreviation
- -
- Publisher
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- Country
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Web of Science categories
No Web of Science category data available.
Scopus ASJC categories
170817112208 Electrical and Electronic Engineering2213 Safety