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Ion-surface interactions and analysisElectron and X-Ray Spectroscopy TechniquesX-ray Spectroscopy and Fluorescence Analysis

Characterization of porous structures in black gold and silver thin layers using Rutherford backscattering spectrometry and neutron depth profiling

J. Vacík, J. Kejzlar, G. Ceccio, R. Mikšová, V. Lavrentiev, M. Vrňata

2026.1.2Radiation Effects and Defects in Solids

DOI: 10.1080/10420150.2026.2647412

Abstract

Abstract is not available.

Citation format

VACÍK, J., et al. Characterization of porous structures in black gold and silver thin layers using rutherford backscattering spectrometry and neutron depth profiling. Radiation Effects and Defects in Solids, 2026, 181(1-2): 254–264.