Ferroelectric and Negative Capacitance DevicesIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Semiconductor Devices and Circuit Design
Hanzhi Xun, M. Fieback, Sicong Yuan, M. Taouil, S. Hamdioui
Abstract
Abstract is not available.
Citation format
XUN, Hanzhi, et al. Systematic analysis of interconnect and contact defects in RRAMs. IEEE Transactions on Emerging Topics in Computing, 2026: 1–14.