Mechanical and Optical ResonatorsForce Microscopy Techniques and ApplicationsMagnetic properties of thin films

Tatsuhiko Mori, Tomoyuki Kurioka, Shu Watanabe, Chun‐Yi Chen, Tso-Fu Mark Chang, Katsuyuki Machida, Hiroyuki Ito, Yoshihiro Miyake, Masato Sone

2026.6.1Micro and Nano Engineering

DOI: 10.1016/j.mne.2026.100367

Abstract

This paper reports the annealing effects on the effective Young's modulus ( E eff ) of Ti/Au multi-layered microcantilevers. Microcantilevers with different dimensions are fabricated and subjected to the annealing. Resonance measurements for the as-fabricated microcantilevers and the annealed microcantilevers are performed to evaluate their resonance frequency. Based on the measured resonance frequency, the E eff of the microcantilevers is determined. The average E eff value of the annealed microcantilevers is increased by approximately 2.6% from 67.5 GPa to 69.3 GPa. Regardless of the annealing, the E eff of the microcantilevers is lower than the Young's modulus of bulk gold (78 GPa).

Citation format

MORI, Tatsuhiko, et al. Annealing effects on effective young’s modulus of ti/au multi-layered microcantilevers. Micro and Nano Engineering, 2026, 32: 100367.