EngineeringPhysicsMaterials Science

Haowei Sun, Jianqiang Qian, Yanan Chen, Yingzi Li, Rui Lin, Peng Cheng, Duo Feng, Zhou Li

2026.7.1MICRON

DOI: 10.1016/j.micron.2026.104043

Abstract

Abstract is not available.

Citation format

SUN, Haowei, et al. Enhancing higher-order modal responses in atomic force microscopy with a segmented constraint methodology. MICRON, 2026, 205: 104043.