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EngineeringMaterials ScienceComputer Science

Double-node upset and half select issue tolerant split-14T SRAM for avionics applications

Debabrata Mondal, S. Naz, A. Shah

2026.7.1INTEGRATION-THE VLSI JOURNAL

DOI: 10.1016/j.vlsi.2026.102737

Abstract

Abstract is not available.

Citation format

MONDAL, Debabrata; NAZ, S.; SHAH, A. Double-node upset and half select issue tolerant split-14t SRAM for avionics applications. INTEGRATION-THE VLSI JOURNAL, 2026, 109: 102737.