Fault Detection and Control SystemsVLSI and Analog Circuit TestingEngineering and Test Systems
Jason Crann, I. Todorov, L. Turowska
2026.5.1ADVANCES IN MATHEMATICS
Abstract
Abstract is not available.
Citation format
CRANN, Jason; TODOROV, I.; TUROWSKA, L. An operator system approach to self-testing. ADVANCES IN MATHEMATICS, 2026, 492: 110884.