GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor TechnologiesAdvanced Power Amplifier Design
J. Nishii, K. Hasegawa, N. Tanaka, T. Niwa, H. Tadano, T. Narita, K. Shiozaki
2026.6.1MICROELECTRONICS RELIABILITY
Abstract
Abstract is not available.
Citation format
NISHII, J., et al. 10 kw inverter with vertical-gan trench MOSFETs and its operation instability related to MOS interface. MICROELECTRONICS RELIABILITY, 2026, 181: 116124.