Thin-Film Transistor TechnologiesCopper Interconnects and ReliabilitySilicon Nanostructures and Photoluminescence

M. Yoon, H. Yeom, Jung‐Hyung Kim, Hyo‐Chang Lee

2026.1.1Applied Science and Convergence Technology

DOI: 10.5757/asct.2026.35.1.45

Abstract

Go to Abstract 1. Introduction 2. Experimental details 3. Results and discussion 4. Conclusion Acknowledgments Conflicts of Interest Reference

Citation format

YOON, M., et al. Effect of substrate temperature on the deposition characteristics of hydrogenated nanocrystalline silicon thin film in plasma-enhanced chemical vapor deposition process. Applied Science and Convergence Technology, 2026, 35(1): 45–49.