From projection to true surface: Curvature‐corrected SEM morphometrics of diatom frustules under hydration variability

Diatom frustules exhibit highly organised silica architectures with submicron features, which are widely studied. Nowadays, scanning electron microscopy (SEM) is commonly used for studying their morphology. However, SEM provides a two‐dimensional projection that distorts the true size of three‐dimensional features. In addition, samples for SEM observations are usually prepared by removing organic parts and drying the remaining parts made of bio‐silica (so‐called frustule).