Y. Taniyasu, Makoto Kasu

2010.8.1NTT Technical Review

DOI: 10.53829/ntr201008sf2

Abstract

Abstract is not available.

Citation format

TANIYASU, Y.; KASU, Makoto. Improved emission efficiency of 210-nm deep-ultraviolet aluminum nitride light-emitting diode. NTT Technical Review, 2010.