Optical properties of nanoscale ferroelectric Sr0.5Ba0.5Nb2O6 films grown on a MgO(110) substrate

Abstract The structure and optical characteristics of the ferroelectric relaxor Sr0.5Ba0.5Nb2O6 thin films grown by RF-cathode sputtering in an oxygen atmosphere on a MgO (110) substrate were studied. X-ray diffraction studies have shown that in Sr0.5Ba0.5Nb2O6 films the polar c axis lies in the conjugation plane with the substrate. The results of spectrophotometric and ellipsometric studies aimed at determining the optical characteristics of the Sr0.5Ba0.5Nb2O6/MgO(110) film, the optical c axis of which is parallel to the free surface, are presented. The refractive indices no, ne and their dispersion, the thickness of the base and damaged film layers, and the volumetric contribution of the surface layer to the film properties were determined.