Deokjin Choi, Boeun Park

2026.3.1World Patent Information

DOI: 10.1016/j.wpi.2026.102430

Abstract

Abstract is not available.

Citation format

CHOI, Deokjin; PARK, Boeun. Structured LLM-based patent comparison across three evaluation dimensions. World Patent Information, 2026, 84: 102430.