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Radiation Effects in ElectronicsLow-power high-performance VLSI designSemiconductor materials and devices

Experimental study of transient dose rate effect on radiation-hardened digital signal processor

Haiwei Xue, F. Fu, Jinxiang Wang, Xudong Huang, Menghua Zhang, Lin Qu

2026.1.1MICROELECTRONICS RELIABILITY

DOI: 10.1016/j.microrel.2025.115974

Abstract

Abstract is not available.

Citation format

XUE, Haiwei, et al. Experimental study of transient dose rate effect on radiation-hardened digital signal processor. MICROELECTRONICS RELIABILITY, 2026, 176: 115974.