EngineeringPhysicsComputer Science

Jing Chen, Haiwei Tan, Yuxuan Dai, Man Li, Kemeng Yang, Jiafei Yao, Jun Zhang, Yufeng Guo

2026.3.1MICROELECTRONICS JOURNAL

DOI: 10.1016/j.mejo.2025.107029

摘要

摘要不可用。

引用格式

CHEN, Jing, et al. Output and transfer characteristics prediction of gan HEMT via neural-network-based compact model parameters extraction. MICROELECTRONICS JOURNAL, 2026, 169: 107029.