EngineeringPhysicsComputer Science
Jing Chen, Haiwei Tan, Yuxuan Dai, Man Li, Kemeng Yang, Jiafei Yao, Jun Zhang, Yufeng Guo
2026.3.1MICROELECTRONICS JOURNAL
摘要
摘要不可用。
引用格式
CHEN, Jing, et al. Output and transfer characteristics prediction of gan HEMT via neural-network-based compact model parameters extraction. MICROELECTRONICS JOURNAL, 2026, 169: 107029.