Reliability, Security, and Sustainability Challenges in 3-D NAND Flash SSDs

Editor’s notes: This article presents a comprehensive review of the scaling challenges in next-generation 3-D NAND technology, along with the associated reliability, security, and sustainability issues, and explores potential mitigation strategies. —Biswajit Ray, Colorado State University, USA —Shyam Raghunathan, Micron Technology, Singapore —Sudeep Pasricha, Colorado State University, USA