EngineeringComputer Science

Ultrahigh reliability estimates through simulation

R. Geist, M. Smotherman

1989.1.24Proceedings - Annual Reliability and Maintainability Symposium

DOI: 10.1109/arms.1989.49625

tlooto Summary

A statistical variance reduction technique called importance sampling is described, and its effectiveness in estimating ultrahigh reliability of life-critical electronics systems is compared with that of the widely used HARP and SURE analytic tools.

Abstract

Abstract is not available.

Citation format

GEIST, R.; SMOTHERMAN, M. Ultrahigh reliability estimates through simulation. Proceedings - Annual Reliability and Maintainability Symposium, 1989: 350–355.