tlooto
Sign up
Open AccessEngineeringPhysics

Current single event effects and radiation damage results for candidate spacecraft electronics

M. O’Bryan, K. Label, Raymond L. Ladbury, C. Poivey, J. W. Howard, Robert A. Reed, S. Kniffin, S. Buchner, J. Bings, Jeffrey Titus, S. Clark, T. Turflinger, C. Seidleck, Cheryl J. Marshall, P. Marshall, Hak S. Kim, D. Hawkins, M. Carts, J. Forney, Michael R. Jones, A. Sanders, T. Irwin, S. Cox, Z. Kahric, Christopher D. Palor, J. A. Sciarini

1998.7.24IEEE Radiation Effects Data Workshop

DOI: 10.1109/redw.2002.1045537

Abstract

Abstract is not available.

Citation format

O’BRYAN, M., et al. Current single event effects and radiation damage results for candidate spacecraft electronics. IEEE Radiation Effects Data Workshop, 1998: 82–105.