Yi-feng Wu, A. Saxler, M. Moore, R. Smith, S. Sheppard, P. Chavarkar, T. Wisleder, U. K. Mishra, P. Parikh
2004.3.3IEEE ELECTRON DEVICE LETTERS
tlooto Summary
GaN HEMTs with optimized field plates achieve high RF current-voltage swings and ultrahigh power densities.
Abstract
GaN high-electron-mobility-transistors (HEMTs) on SiC were fabricated with field plates of various dimensions for optimum performance. Great enhancement in radio frequency (RF) current-voltage swings was achieved with acceptable compromise in gain, through both reduction in the trapping effect and increase in breakdown voltages. When biased at 120 V, a continuous wave output power density of 32.2 W/mm and power-added efficiency (PAE) of 54.8% at 4 GHz were obtained using devices with dimensions of 0.55/spl times/246 /spl mu/m/sup 2/ and a field-plate length of 1.1 /spl mu/m. Devices with a shorter field plate of 0.9 /spl mu/m also generated 30.6 W/mm with 49.6% PAE at 8 GHz. Such ultrahigh power densities are a dramatic improvement over the 10-12 W/mm values attained by conventional gate GaN-based HEMTs.
Citation format
WU, Yi-feng, et al. 30-W/mm gan HEMTs by field plate optimization. IEEE ELECTRON DEVICE LETTERS, 2004, 25: 117–119.