EngineeringPhysicsMaterials Science

Yi-feng Wu, A. Saxler, M. Moore, R. Smith, S. Sheppard, P. Chavarkar, T. Wisleder, U. K. Mishra, P. Parikh

2004.3.3IEEE ELECTRON DEVICE LETTERS

DOI: 10.1109/led.2003.822667

tlooto Summary

GaN HEMTs with optimized field plates achieve high RF current-voltage swings and ultrahigh power densities.

Abstract

GaN high-electron-mobility-transistors (HEMTs) on SiC were fabricated with field plates of various dimensions for optimum performance. Great enhancement in radio frequency (RF) current-voltage swings was achieved with acceptable compromise in gain, through both reduction in the trapping effect and increase in breakdown voltages. When biased at 120 V, a continuous wave output power density of 32.2 W/mm and power-added efficiency (PAE) of 54.8% at 4 GHz were obtained using devices with dimensions of 0.55/spl times/246 /spl mu/m/sup 2/ and a field-plate length of 1.1 /spl mu/m. Devices with a shorter field plate of 0.9 /spl mu/m also generated 30.6 W/mm with 49.6% PAE at 8 GHz. Such ultrahigh power densities are a dramatic improvement over the 10-12 W/mm values attained by conventional gate GaN-based HEMTs.

Citation format

WU, Yi-feng, et al. 30-W/mm gan HEMTs by field plate optimization. IEEE ELECTRON DEVICE LETTERS, 2004, 25: 117–119.