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EngineeringPhysicsMaterials Science

ESD failure mechanisms of inductive and magnetoresistive recording heads

A. Wallash, T. Hughbanks, S. Voldman

1996.10.1Electrical Overstress/Electrostatic Discharge Symposium Proceedings

DOI: 10.1016/s0304-3886(96)00013-7

Abstract

Abstract is not available.

Citation format

WALLASH, A.; HUGHBANKS, T.; VOLDMAN, S. ESD failure mechanisms of inductive and magnetoresistive recording heads. Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1996: 322–330.