Computer ScienceEngineering
Ryan Gabrys, Eitan Yaakobi, L. Dolecek
tlooto Summary
A class of codes that exploits the asymmetric nature of the error patterns in a Flash device using tensor product operations are proposed, which significantly delay the onset of errors and therefore have the potential to prolong the lifetime of the memory device.
Abstract
Abstract is not available.
Citation format
GABRYS, Ryan; YAAKOBI, Eitan; DOLECEK, L. Graded bit-error-correcting codes with applications to flash memory. IEEE TRANSACTIONS ON INFORMATION THEORY, 2013, 59: 2315–2327.