Computer ScienceEngineering

Ryan Gabrys, Eitan Yaakobi, L. Dolecek

2013.4.1IEEE TRANSACTIONS ON INFORMATION THEORY

DOI: 10.1109/tit.2012.2234207

tlooto Summary

A class of codes that exploits the asymmetric nature of the error patterns in a Flash device using tensor product operations are proposed, which significantly delay the onset of errors and therefore have the potential to prolong the lifetime of the memory device.

Abstract

Abstract is not available.

Citation format

GABRYS, Ryan; YAAKOBI, Eitan; DOLECEK, L. Graded bit-error-correcting codes with applications to flash memory. IEEE TRANSACTIONS ON INFORMATION THEORY, 2013, 59: 2315–2327.