Engineering

Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors

S. Voldman, G. Gerosa, V. Gross, N. Dickson, S. Furkay, J. Slinkman

1995Electrical Overstress/Electrostatic Discharge Symposium Proceedings

DOI: 10.1109/eosesd.1995.478267

Abstract

Abstract is not available.

Citation format

VOLDMAN, S., et al. Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors. Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995: 43–61.