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Computer ScienceEngineering

On the relative value of cross-company and within-company data for defect prediction

Burak Turhan, T. Menzies, A. Bener, Justin S. Di Stefano

2009.10.1EMPIRICAL SOFTWARE ENGINEERING

DOI: 10.1007/s10664-008-9103-7

tlooto Summary

It is demonstrated in this paper that the minimum number of data samples required to build effective defect predictors can be quite small and can be collected quickly within a few months.

Abstract

Abstract is not available.

Citation format

TURHAN, Burak, et al. On the relative value of cross-company and within-company data for defect prediction. EMPIRICAL SOFTWARE ENGINEERING, 2009, 14: 540–578.