Computer ScienceMathematics

M. Skurichina, R. Duin

2002.6.7PATTERN ANALYSIS AND APPLICATIONS

DOI: 10.1007/s100440200011

tlooto Summary

Simulation studies show that the performance of the combining techniques is strongly affected by the small sample size properties of the base classifier: boosting is useful for large training sample sizes, while bagging and the random subspace method are useful for criticalTraining sample sizes.

Abstract

Abstract is not available.

Citation format

SKURICHINA, M.; DUIN, R. Bagging, boosting and the random subspace method for linear classifiers. PATTERN ANALYSIS AND APPLICATIONS, 2002, 5: 121–135.