Materials Science

Investigation on FT-IR Spectroscopy for Eight Different Sources of SiO_2

Resumen de tlooto

Different sources of SiO2 distinguished by FT-IR spectroscopy due to varying forming mechanisms and composite methods.

Resumen

Eight different sources of SiO2 was distinguished by Fourier transform infrared spectroscopy in the paper.Although they are similar in infrared spectrum,there are differences in the characteristic peaks of infrared spectrum caused by difference of forming mechanism or composite method.According to the the characteristic peaks of infrared spectrum,different sources of SiO2 can be easily identified.The results will provide scientific proof for the exploitation,study and application of SiO2.

Formato de cita

JING-CHANG, Shao. Investigation on FT-IR spectroscopy for eight different sources of sio_2. Bulletin of the Chinese Ceramic Society, 2011.