EngineeringPhysicsMaterials Science

J. Owens, D. Halchin, K. Lear, W. Lee, J. S. Harris

1989.6.13IEEE MTT-S International Microwave Symposium Digest

DOI: 10.1109/mwsym.1989.38768

tlooto Summary

Resonant tunneling devices grown by MBE exhibit unique microwave characteristics, with complicated capacitance characteristics observed at large-indium-content wells.

Abstract

Resonant tunnel devices grown by molecular-beam epitaxy (MBE) have been measured experimentally using network analysis techniques from 130 MHz to 20 GHz. A circuit model for the devices has been extracted for two different InGaAs well structures at a fixed bias point, which fits the measured data well and is useful for circuit design. Additionally, the device impedance has been measured as a function of bias at a fixed frequency point. Complicated capacitance characteristics were observed for the devices with large-indium-content wells.<<ETX>>

Citation format

OWENS, J., et al. Microwave characteristics of MBE grown resonant tunneling devices. IEEE MTT-S International Microwave Symposium Digest, 1989: 471–474vol.1.