Open AccessEngineeringMaterials ScienceComputer Science
F. Jensen
1989.1.24Proceedings - Annual Reliability and Maintainability Symposium
tlooto Summary
A discussion is presented of a model based on the assumption that all failures basically are due to wearout, where large flaws connect with early life failures, small flaws connected with end-of-life-failures.
Abstract
Abstract is not available.
Citation format
JENSEN, F. Component failures based on flaw distributions. Proceedings - Annual Reliability and Maintainability Symposium, 1989: 91–95.