R. B. Hurley, I. Kaufman, R. Roy
1989.6.13IEEE MTT-S International Microwave Symposium Digest
tlooto Summary
A 1989 technique for noncontacting thickness monitoring of thin layers using a planar microstrip transmission line structure is presented.
Abstract
A microwave technique for measuring of the height of a thin layer of fluid or a solid coating on a metallic surface using a planar microstrip transmission line structure is presented. A device was designed to monitor the height of a film of water up to about 1 mm. The method produced consistent results and can be adapted for use without microwave frequency measurement devices.<<ETX>>
Citation format
HURLEY, R. B.; KAUFMAN, I.; ROY, R. Microstrip noncontacting thickness monitor. IEEE MTT-S International Microwave Symposium Digest, 1989: 905–908vol.3.