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EngineeringPhysics

Upset hardened memory design for submicron CMOS technology

T. Calin, M. Nicolaidis, R. Velazco

1996.12.1IEEE TRANSACTIONS ON NUCLEAR SCIENCE

DOI: 10.1109/23.556880

Abstract

Abstract is not available.

Citation format

CALIN, T.; NICOLAIDIS, M.; VELAZCO, R. Upset hardened memory design for submicron CMOS technology. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43: 2874–2878.