EngineeringPhysics
R. Baumann
2001.3.1IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
tlooto Summary
This 2001 review paper discusses the three primary radiation mechanisms causing soft errors in semiconductor devices and methods to reduce their impact.
Abstract
In this review paper, we summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in semiconductor devices and discuss methods useful for reducing the impact of the effects in final packaged parts.
Citation format
BAUMANN, R. Soft errors in advanced semiconductor devices-part i: The three radiation sources. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2001, 1: 17–22.