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The IEEE Reliability Test System-1996. A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee

C. Grigg, P. Wong, P. Albrecht, R. Allan, M. Bhavaraju, R. Billinton, Q. Chen, C. C. Fong, S. Haddad, S. Kuruganty, Wenyuan Li, R. Mukerji, D. Patton, N. Rau, N. Reppen, A. Schneider, M. Shahidehpour, C. Singh

1999.8.1IEEE TRANSACTIONS ON POWER SYSTEMS

DOI: 10.1109/59.780914

Abstract

Abstract is not available.

Citation format

GRIGG, C., et al. The IEEE reliability test system-1996. a report prepared by the reliability test system task force of the application of probability methods subcommittee. IEEE TRANSACTIONS ON POWER SYSTEMS, 1999, 14: 1010–1020.