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PhysicsEngineeringChemistry

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

L. Terman

1962.9.1SOLID-STATE ELECTRONICS

DOI: 10.1016/0038-1101(62)90111-9

Abstract

Abstract is not available.

Citation format

TERMAN, L. An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes. SOLID-STATE ELECTRONICS, 1962, 5: 285–299.