EngineeringComputer Science

Standard Analysis for Transfer Delay in CTCS-3

Yuan Cao, Lian-chuan Ma, Shuo Xiao, Xia Zhang, Wei Xu

2017.9.1CHINESE JOURNAL OF ELECTRONICS

DOI: 10.1049/cje.2017.08.024

tlooto Summary

Simulation results confirm that the transfer delay in CTCS-3 will be improved inevitably and can meet the standard requirements under all cases, and the probability is greater than 99% for redundant MTs and networks.

Abstract

Abstract is not available.

Citation format

CAO, Yuan, et al. Standard analysis for transfer delay in CTCS-3. CHINESE JOURNAL OF ELECTRONICS, 2017, 26: 1057–1063.