MEASUREMENT OF DEFORMATION OF PURE Ni FOILS BY SPECKLE PATTERN INTERFEROMETRY

By employing the sequence pulse counting method (SPCM) and a high sensitive micro load-sensor, a precise and sensitive measurement system was established to measure the load-deflection curves of pure Ni foils (purity 99.99%) under three-point micro bending. The whole deformation field and the applied force were recorded precisely and completely. On the basis of the measured curves of the pure Ni foil beams with various thickness (10 - 100μm), it is found that the elastic bending rigidity is strongly dependent upon the thickness of the micro beams, that is, an obvious size effect is demonstrated.