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Review on surface-characterization applications of X-ray photoelectron spectroscopy (XPS): Recent developments and challenges

D. N. Krishna, J. Philip

2022.12.1Applied Surface Science Advances

DOI: 10.1016/j.apsadv.2022.100332

Abstract

Abstract is not available.

Citation format

KRISHNA, D. N.; PHILIP, J. Review on surface-characterization applications of x-ray photoelectron spectroscopy (XPS): Recent developments and challenges. Applied Surface Science Advances, 2022.