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PhysicsChemistry

Determination of effective capacitance and film thickness from constant-phase-element parameters

Bryan Hirschorn, M. Orazem, B. Tribollet, Vincent Vivier, I. Frateur, Marco Musiani

2010.8.30ELECTROCHIMICA ACTA

DOI: 10.1016/j.electacta.2009.10.065

Abstract

Abstract is not available.

Citation format

HIRSCHORN, Bryan, et al. Determination of effective capacitance and film thickness from constant-phase-element parameters. ELECTROCHIMICA ACTA, 2010, 55: 6218–6227.