B. M. Kessels, M. L. J. Verhees, A. M. Steenhoek, R. Fey, N. van de Wouw

2021.4.30Conference Proceedings of the Society for Experimental Mechanics Series

DOI: 10.1007/978-3-030-75910-0_1

Abstract

Abstract is not available.

Citation format

KESSELS, B. M., et al. Sensitivity-based substructure error propagation for efficient assembly model reduction. Conference Proceedings of the Society for Experimental Mechanics Series, 2021.