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Open AccessPhysicsEngineeringMaterials Science

High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing

A. Tognazzi, D. Rocco, M. Gandolfi, A. Locatelli, L. Carletti, C. de Angelis

2021.9.6Optics

DOI: 10.3390/opt2030018

tlooto Summary

Researchers propose a high-quality factor silicon membrane metasurface for intensity-based refractive index sensing with record efficiencies.

Abstract

We propose a new sensing device based on all-optical nano-objects placed in a suspended periodic array. We demonstrate that the intensity-based sensing mechanism can measure environment refractive index change of the order of 1.8×10−6, which is close to record efficiencies in plasmonic devices.

Citation format

TOGNAZZI, A., et al. High quality factor silicon membrane metasurface for intensity-based refractive index sensing. Optics, 2021.