Computer Science

Neha Nandal, Rohit Tanwar, Jyotika Pruthi

2020.2.26Spatial Information Research

DOI: 10.1007/s41324-020-00320-2

tlooto Summary

A novel approach has been presented that utilize aspect level sentiment detection, which focuses on the features of the item and gives a rank for its classification in negativity or positivity.

Abstract

Abstract is not available.

Citation format

NANDAL, Neha; TANWAR, Rohit; PRUTHI, Jyotika. Machine learning based aspect level sentiment analysis for amazon products. Spatial Information Research, 2020: 1–7.