SCOPUS
Records of the IEEE International Workshop on Memory Technology, Design and Testing
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Identifiers, indexing coverage, and citation metrics for the academic journal Records of the IEEE International Workshop on Memory Technology, Design and Testing. Identifiers: ISSN 1087-4852. Indexed in SCOPUS. tlooto lists 18 papers from this journal.
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Journal profile
- ISSN
- 1087-4852
- eISSN
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Web of Science categories
No Web of Science category data available.
Scopus ASJC categories
17082208 Electrical and Electronic Engineering3104 Condensed Matter Physics
Papers in this journal
Recent papers
- Windowed MRAM sensing scheme
2000 · 2 citations
- 66 MHz 2.3 M ternary dynamic content addressable memory
2000 · 35 citations
- Optimizing memory tests by analyzing defect coverage
2000 · 10 citations
- Fast voltage regulator for multilevel flash memories
2000 · 6 citations
- A simple built-in self test for dual ported SRAMs
2000 · 3 citations
Most cited papers
- Diagnostic testing of embedded memories based on output tracing
2000 · 19 citations
- Defect analysis and realistic fault model extensions for static random access memories
2000 · 19 citations
- Tutorial: synchronous dynamic memory test construction-a field approach
2000 · 13 citations
- March tests for realistic faults in two-port memories
2000 · 11 citations
- Yield analysis methodology for low defectivity wafer fabs
2000 · 10 citations