SCOPUS
Electronic Device Failure Analysis
ASM International, United States
Electronic Device Failure Analysis is an academic journal published by ASM International (United States). Identifiers: ISSN 1537-0755. Indexed in SCOPUS. Metrics: CiteScore 0.4, SJR 0.131, SNIP 0.11. tlooto lists 29 papers from this journal.
CiteScore
0.40
Scopus उद्धरण मापदंड
SJR
0.131
SCImago रैंक
SNIP
0.11
स्रोत-सामान्यीकृत प्रभाव
प्रतिशत रैंक
-
JIF प्रतिशतक रैंक
जर्नल प्रोफ़ाइल
- ISSN
- 1537-0755
- eISSN
- -
- संक्षेप
- -
- प्रकाशक
- ASM International
- देश
- United States
Web of Science श्रेणियाँ
Web of Science श्रेणी का डेटा उपलब्ध नहीं है।
Scopus ASJC श्रेणियाँ
2208 Electrical and Electronic Engineering2213 Safety
Papers in this journal
Recent papers
- A Step Toward Automation in Failure Analysis by FIB-SEM 3D Tomography and AI Segmentation
2026
- Advanced Semiconductor Failure Analysis Using In-Situ AFM in FIB-SEM
2026
- Electrical Fault Localization of High-Density 3D Interconnect Via Chains Through Innovative Sample Preparation
2026
- Failure Analysis Outreach Council: Awareness, Education, Influence
2026
- From System Zap to Silicon Improvement: Advanced Fault Isolation of USB2 Electrostatic Discharge Failures
2026