SCOPUS
Electronic Device Failure Analysis
ASM International, United States
Electronic Device Failure Analysis is an academic journal published by ASM International (United States). Identifiers: ISSN 1537-0755. Indexed in SCOPUS. Metrics: CiteScore 0.4, SJR 0.131, SNIP 0.11. tlooto lists 29 papers from this journal.
CiteScore
0.40
Scopus citation metric
SJR
0.131
SCImago rank
SNIP
0.11
Source normalized impact
Percentage rank
-
JIF percentile rank
Journal profile
- ISSN
- 1537-0755
- eISSN
- -
- Abbreviation
- -
- Publisher
- ASM International
- Country
- United States
Web of Science categories
No Web of Science category data available.
Scopus ASJC categories
2208 Electrical and Electronic Engineering2213 Safety
Papers in this journal
Recent papers
- A Step Toward Automation in Failure Analysis by FIB-SEM 3D Tomography and AI Segmentation
2026
- Advanced Semiconductor Failure Analysis Using In-Situ AFM in FIB-SEM
2026
- Electrical Fault Localization of High-Density 3D Interconnect Via Chains Through Innovative Sample Preparation
2026
- Failure Analysis Outreach Council: Awareness, Education, Influence
2026
- From System Zap to Silicon Improvement: Advanced Fault Isolation of USB2 Electrostatic Discharge Failures
2026