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IEEE Design & Test

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

IEEE Design & Test is an academic journal published by IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. Identifiers: ISSN 2168-2356, eISSN 2168-2364. Indexed in SCIE. Metrics: JIF 1.9. Subject areas: COMPUTER SCIENCE, ELECTRICAL & ELECTRONIC, ENGINEERING, ENGINEERING, ELECTRICAL & ELECTRONIC. tlooto lists 832 papers from this journal.

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Journal profile

ISSN
2168-2356
eISSN
2168-2364
Abbreviation
IEEE DES TEST
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Country
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Web of Science categories

SCIECOMPUTER SCIENCE, ELECTRICAL & ELECTRONIC, ENGINEERING, HARDWARE & ARCHITECTURE

Scopus ASJC categories

No ASJC category data available.

Keywords

Computer Science, Hardware & Architecture | Engineering, Electrical & Electronic

Papers in this journal

Recent papers

  1. The Internet Likes to Watch

    2026

  2. Reliability, Security, and Sustainability Challenges in 3-D NAND Flash SSDs

    2026 · 5 citations

  3. Bridging RTL and Assertion Generation With Large Language Models

    2026 · 1 citations

  4. A Tutorial on Secure and Efficient Firmware Delivery

    2026

  5. DiffLight: Generative Diffusion Model Acceleration With Silicon Photonics

    2026

Most cited papers

  1. Approximate Computing: A Survey

    2016 · 495 citations

  2. Security and Privacy in Cyber-Physical Systems: A Survey of Surveys

    2017 · 262 citations

  3. AxBench: A Multiplatform Benchmark Suite for Approximate Computing

    2017 · 225 citations

  4. Spectre Returns! Speculation Attacks Using the Return Stack Buffer

    2018 · 218 citations

  5. The 3-D Interconnect Technology Landscape

    2016 · 149 citations