SCIESCOPUSQ1
Applied Surface Science Advances
ELSEVIER, Netherlands
Applied Surface Science Advances is an academic journal published by ELSEVIER (Netherlands). Identifiers: ISSN 2666-5239, eISSN 2666-5239. Indexed in SCIE, SCOPUS. Metrics: JIF 8.7, CiteScore 15.3, SJR 1.467, SNIP 1.91. Subject areas: PHYSICS, CONDENSED MATTER. tlooto lists 1,015 papers from this journal.
CiteScore
15.30
Scopus citation metric
SJR
1.467
SCImago rank
SNIP
1.91
Source normalized impact
Percentage rank
-
JIF percentile rank
Journal profile
- ISSN
- 2666-5239
- eISSN
- 2666-5239
- Abbreviation
- APPL SURF SCI ADV
- Publisher
- ELSEVIER
- Country
- Netherlands
Web of Science categories
No Web of Science category data available.
Scopus ASJC categories
2508 Surfaces3110 Surfaces and Interfaces
Papers in this journal
Recent papers
- Retraction notice to “Chitosan-Based Adsorbents for Water Purification: Mechanisms, Performance, and Sustainability” [Applied Surface Science Advances 30 (2025) 100804]
2026
- Morphology dependent decomposition and pore evolution during oxidation of Cr2AlC coatings revealed by correlative tomography
2026
- Polymer-iron oxide hybrid films for controlling electrokinetic properties
2026
- Corrigendum to “Enhancing hydrophilic properties of spherical C(sp2)-hybridized carbon nanostructures through the targeted oxidation of their outer layer” [Applied Surface Science Advances 30 (2025) 100906]
2026
- Defect analysis of Al-delta-doped ZnO thin films by positron annihilation spectroscopy
2026
Most cited papers
- Review on surface-characterization applications of X-ray photoelectron spectroscopy (XPS): Recent developments and challenges
2022 · 572 citations
- Anode materials for lithium-ion batteries: A review
2022 · 528 citations
- Magnetic nanoparticles in biomedical applications: A review
2021 · 326 citations
- Recent advances of additive manufacturing in implant fabrication – A review
2023 · 251 citations
- Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters
2024 · 193 citations