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MICROELECTRONICS RELIABILITY

PERGAMON-ELSEVIER SCIENCE LTD

MICROELECTRONICS RELIABILITY is an academic journal published by PERGAMON-ELSEVIER SCIENCE LTD. Identifiers: ISSN 0026-2714, eISSN 1872-941X. Indexed in SCIE. Metrics: JIF 1.9. Subject areas: APPLIED, ELECTRICAL & ELECTRONIC, ENGINEERING, NANOSCIENCE & NANOTECHNOLOGY. tlooto lists 7,533 papers from this journal.

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Journal profile

ISSN
0026-2714
eISSN
1872-941X
Abbreviation
MICROELECTRON RELIAB
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Country
-

Web of Science categories

SCIEAPPLIED, ELECTRICAL & ELECTRONIC, ENGINEERING, NANOSCIENCE & NANOTECHNOLOGY, PHYSICS

Scopus ASJC categories

No ASJC category data available.

Keywords

Engineering, Electrical & Electronic | Nanoscience & Nanotechnology | Physics, Applied

Papers in this journal

Recent papers

  1. A novel partitioned homogenization approach for rapid and accurate vibration analysis of printed circuit boards

    2026 · 3 citations

  2. 10 kW inverter with vertical-GaN trench MOSFETs and its operation instability related to MOS interface

    2026 · 1 citations

  3. Radiation effect in FD-SOI nanowire FETs due to high dose rate gamma-ray under variable irradiation temperatures

    2026

  4. Structural optimization design of LTCC substrate and their impacts on thermal performances of system-in-package

    2026

  5. Experimental study of transient dose rate effect on radiation-hardened digital signal processor

    2026

Most cited papers

  1. Solder joint fatigue models: review and applicability to chip scale packages

    2000 · 511 citations

  2. Time-series models for reliability evaluation of power systems including wind energy

    1996 · 483 citations

  3. Genetic algorithms in optimization of system reliability.

    1995 · 428 citations

  4. A novel BIST for monitoring aging/temperature by self-triggered scheme to improve the reliability of STT-MRAM

    2020 · 333 citations

  5. Timed Petri nets definitions, properties, and applications

    1991 · 269 citations